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Atomic Force Microscopy/Scanning Tunneling Microscopy 3 Cohen, Samuel H.

By: Material type: TextTextPublication details: Kluwer Academic Publishers; 1999Description: On-campus e-Book by ebrary under Digital Library Program of Higher Education Commission (HEC) of PakistanISBN:
  • 9780306470950
Subject(s): Online resources:
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Holdings
Item type Current library Call number Status Date due Barcode
e-Book e-Book ICCBS Digital Library Not for loan